Debug and Test Problems

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Weaknesses in this category are related to hardware debug and test interfaces such as JTAG and scan chain.

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• CWE-1191 On-Chip Debug and Test Interface With Improper Access Control
• CWE-1234 Hardware Internal or Debug Modes Allow Override of Locks
• CWE-1243 Sensitive Non-Volatile Information Not Protected During Debug
• CWE-1244 Internal Asset Exposed to Unsafe Debug Access Level or State
• CWE-1258 Exposure of Sensitive System Information Due to Uncleared Debug Information
• CWE-1272 Sensitive Information Uncleared Before Debug/Power State Transition
• CWE-1291 Public Key Re-Use for Signing both Debug and Production Code
• CWE-1295 Debug Messages Revealing Unnecessary Information
• CWE-1296 Incorrect Chaining or Granularity of Debug Components
• CWE-1313 Hardware Allows Activation of Test or Debug Logic at Runtime
• CWE-1323 Improper Management of Sensitive Trace Data
• CWE-319 Cleartext Transmission of Sensitive Information