Manufacturing and Life Cycle Management Concerns

Opis

Weaknesses in this category are root-caused to defects that arise in the semiconductor-manufacturing process or during the life cycle and supply chain.

Wpisy w tej grupie

• CWE-1059 Insufficient Technical Documentation
• CWE-1248 Semiconductor Defects in Hardware Logic with Security-Sensitive Implications
• CWE-1266 Improper Scrubbing of Sensitive Data from Decommissioned Device
• CWE-1269 Product Released in Non-Release Configuration
• CWE-1273 Device Unlock Credential Sharing
• CWE-1297 Unprotected Confidential Information on Device is Accessible by OSAT Vendors